MTSC Technology Sdn Bhd offers a wide range of services to meet your reliability testing, FA needs on your electronic, electrical,component(new/reworked) pcba, bare pcb and mechanical product . We offer :

  1. Quality Assurance Verification
  2. Design Verification
  3. High Accelerated Life Testing (HALT)
  4. Highly Accelerated Stress Screening (HASS)
  5. Characterization Test
  6. Power/Thermal Cycling Test
  7. Design Marginality Test
  8. Humidity Test
  9. Thermal Shock Test
  10. HASS screen development
  11. Prototype testing
  12. Failure analysis and repair
  13. Salt Spray testing
  14. Life testing(long hour burn-in)
  15. High Potential testing
  16. SEM- Scanning Electron Microscope
  17. IR Reflow
  18. Solderability Test
  19. MTBF
  20. Burn-in
  21. Coplanity Check
  22. Tensile Check
  23. Push/Pull check
  24. Functional Test
  25. Vibration and Mechanical Shock
  26. Transportation Vibration


Specification used for testing

    • IEC 68-1
        Climatic testing for electronic product eg from cold -55C to hot temperature of 150C

    • IEC 68-2
        Vibration and transportation testing for electronic product

    • IEC 1000-4
        EMC publication
  • MIL-STD-883D/202F Component testing and reliability confirmation eg capacitors, resistors and etc


Machine Capability

    • Programmable Temperature and Humidity Chamber
        6 unit; -50C to 150C; 225 litre; 99RH
    • ESS Chamber
        1 units; -70C to 150C with ramp rate up to 60C/min
    • Salt Spray tester
        1 unit
    • Burn-in Oven
        6 unit; 25C to 200C
    • Thermal Shock Chamber
        3 unit air to air; -70 to 175C with ramp rate exceeding 60C/min


Test Equipment

  • Programmable DC/AC sources
  • Programmable DC loads
  • Network Analyser
  • Spectrum Analyser
  • Transmission Testers
  • Programmable meters
  • Programmable Oscilloscope
  • Programmable Data Acquisition meter
  • Programmable LRC meter
  • Portable DC sources
  • Hand held meters
  • Scanning Electron Microscope
  • Ionic contamination tester
  • Compression/Tensile Tester


What HALT and HASS Can Do For Your Products as an EXCELLENT FA tools
Highly accelerated life test (HALT) and highly accelerated stress screen (HASS) are two processes that very quickly uncover problems in the design and production phases of your products. Both rely on the concept of time compression.
That is, HALT and HASS use much higher stresses than exist in the field environment to force failures to occur in significantly less time than would be required in a normal environment.

In HALT, every stimulus of potential value is used during the design phase to find the weak links in the design and fabrication processes of a product. These stimuli may include all-axis impact vibration, broad-range thermal cycling, burn-in, over-voltage, voltage cycling, humidity and whatever else exposes relevant defects in the product.

The stresses are not meant to simulate the field environments but to find the weak links in the design and manufacturing processes using only a few units and in a very short period of time. They are stepped up to well beyond the expected field environments until the fundamental limit of the technology is reached. Reaching the fundamental limit generally requires fixing everything found, even if it is uncovered above the qualification levels.

HASS screens use the highest possible stresses, frequently well beyond the qualification level, to attain time compression in the screens. Many stimuli exhibit an exponential acceleration of flaw precipitation. Using these stimuli results in a much shorter duration of stress, if we use the correct stress, so a drastic reduction in screening equipment and manpower is realized.

The screens must be of acceptable fatigue-damage accumulation, or lifetime degradation, using proof-of-screen techniques where one or more products are screened repeatedly to show that enough product life is left after just a few screens. Generally, HASS is not possible unless a comprehensive HALT has been performed.

Without HALT, fundamental design limitations will tend to restrict the acceptable stress levels in production screens and prevent the large accelerations of flaw precipitation, or time compression, possible with a very robust product. A less than robust product probably cannot be effectively screened by the classical screens without substantial reduction in its useful field life since it will have none to spare.

HALT has provided substantial (five to 1,000 times) MTBF gains even when used without production screening and has reduced product time to market, warranty expenses, design and sustaining engineering, and total development costs. HALT still is an emerging technology and continues to be improved at an amazing rate.

Today, HALT and HASS are required on an ever-increasing number of commercial and military programs. Many of the leading commercial companies use HALT and HASS techniques with all-axis impact vibration and moderate to ultra-rate thermal systems successfully; however, most are being relatively quiet about it because of the phenomenal improvements in quality and reliability and vast cost savings.

The aerospace industry and the military have been slow to accept the advanced techniques because stressing the product above the expected field environment is quite foreign to them. And even if they wanted to use HALT and HASS, it is very difficult to specify or interpret in contractual language. You must want to obtain top quality for your products to adopt HALT and HASS.

The basic philosophy is: Find the problems however we can and then fix them. This constitutes a paradigm shift.